0119 00AC
0120 00AC 0B  serflg3 ; select error flag 3 (full BST interconnect open faults)
0121 00AD 02 00 24  ld cnt,36 ; length of BST chain 0
0122 00B0 04  nshf  ; shift 1st TP (for open testing), no compare
0123 00B1 000000FC03 int0 .db $00,$00,$00,$fc,$03
0124 00B6 01  tms1  ; BST chain 0, >> Update DR
0125 00B7 01  tms1  ; BST chain 0, >> Sel. DR scan
0126 00B8 1B  seltap1 ; switch to TAP 1
0127 00B9 02 00 12  ld cnt,18 ; length of BST chain 1
0128 00BC 04  nshf  ; shift the 1st TP (for open faults) on BST chain 1
0129 00BD 00 03 00 int1 .db $00,$03,$00
0130 00C0 01  tms1  ; BST chain 1, >> Update DR
0131 00C1 01  tms1  ; BST chain 1, >> Sel. DR scan
0132 00C2 13  ssa1  ; SyncOutA goes high (BST test data applied)
0133 00C3 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0134 00C4 00  tms0  ; BST chain 1, >> Capture DR
0135 00C5 00  tms0  ; BST chain 1, >> Shift DR
0136 00C6 1A  seltap0 ; switch to TAP 0
0137 00C7 00  tms0  ; BST chain 0, >> Capture DR
0138 00C8 00  tms0  ; BST chain 0, >> Shift DR
0139 00C9 12  ssa0  ; SyncOutA goes low (BST test results captured)
0140 00CA 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0141 00CB 02 00 24  ld cnt,36 ; length of BST chain 0
0142 00CE 05  nshfcp ; test pattern for open faults
0143 00CF 000000000000 int2 .db $00,$00,$00,$00,$00,$00,$0c,$00,$03,$fc,$00,$fc,$03,$00,$0f
0144 00DE 06 04 01  jpe theend ; stop the test, if a net is found open, or s-a-1
0145 00E1 01  tms1  ; BST chain 0, >> Update DR
0146 00E2 01  tms1  ; BST chain 0, >> Sel. DR scan
0147 00E3 1B  seltap1 ; switch to TAP 1
0148 00E4 02 00 12  ld cnt,18 ; length of BST chain 1
0149 00E7 05  nshfcp ; TP for open faults, BST chain 1
0150 00E8 FF0000030003 int3 .db $ff,$00,$00,$03,$00,$03,$00,$00,$03
0151 00F1 06 04 01  jpe theend ; stop the test, if a net is found open, or s-a-1
0152 00F4 01  tms1  ; BST chain 1, >> Update DR
0153 00F5 01  tms1  ; BST chain 1, >> Sel. DR scan
0154 00F6 13  ssa1  ; SyncOutA goes high (BST test data applied)
0155 00F7 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0156 00F8 00  tms0  ; BST chain 1, >> Capture DR
0157 00F9 00  tms0  ; BST chain 1, >> Shift DR
0158 00FA 1A  seltap0 ; switch to TAP 0
0159 00FB 00  tms0  ; BST chain 0, >> Capture DR
0160 00FC 00  tms0  ; BST chain 0, >> Shift DR
0161 00FD 12  ssa0  ; SyncOutA goes low (BST test results captured)
0162 00FE 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0163 00FF 0C  serflg4 ; select error flag 4 (full BST interconnect short faults)
0164 0100 02 00 24  ld cnt,36 ; length of BST chain 0
0165 0103 05  nshfcp ; test pattern for short faults
0166 0104 000000000000 int4 .db $00,$00,$00,$00,$00,$00,$04,$0c,$03,$fc,$fc,$fc,$03,$03,$0f
0167 0113 06 04 01  jpe theend ; stop the test, if a short fault is found
0168 0116 01  tms1  ; BST chain 0, >> Update DR
0169 0117 01  tms1  ; BST chain 0, >> Sel. DR scan
0170 0118 1B  seltap1 ; switch to TAP 1
0171 0119 02 00 12  ld cnt,18 ; length of BST chain 1
0172 011C 05  nshfcp ; TP for short faults, BST chain 1
0173 011D 55FF00030303 int5 .db $55,$ff,$00,$03,$03,$03,$00,$00,$03
0174 0126 06 04 01  jpe theend ; stop the test, if a short fault is found
0175 0129 01  tms1  ; BST chain 1, >> Update DR
0176 012A 01  tms1  ; BST chain 1, >> Sel. DR scan
0177 012B 13  ssa1  ; SyncOutA goes high (BST test data applied)
0178 012C 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0179 012D 00  tms0  ; BST chain 1, >> Capture DR
0180 012E 00  tms0  ; BST chain 1, >> Shift DR
0181 012F 1A  seltap0 ; switch to TAP 0
0182 0130 00  tms0  ; BST chain 0, >> Capture DR
0183 0131 00  tms0  ; BST chain 0, >> Shift DR
0184 0132 12  ssa0  ; SyncOutA goes low (BST test results captured)
0185 0133 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0186 0134 02 00 24  ld cnt,36 ; length of BST chain 0
0187 0137 05  nshfcp ; test pattern for short faults
0188 0138 000000000000 int6 .db $00,$00,$00,$00,$00,$00,$08,$04,$03,$fc,$54,$fc,$03,$01,$0f
0189 0147 06 04 01  jpe theend ; stop the test, if a short fault is found
0190 014A 01  tms1  ; BST chain 0, >> Update DR
0191 014B 01  tms1  ; BST chain 0, >> Sel. DR scan
0192 014C 1B  seltap1 ; switch to TAP 1
0193 014D 02 00 12  ld cnt,18 ; length of BST chain 1
0194 0150 05  nshfcp ; TP for short faults, BST chain 1
0195 0151 AA5500030103 int7 .db $aa,$55,$00,$03,$01,$03,$00,$00,$03
0196 015A 06 04 01  jpe theend ; stop the test, if a short fault is found
0197 015D 01  tms1  ; BST chain 1, >> Update DR
0198 015E 01  tms1  ; BST chain 1, >> Sel. DR scan
0199 015F 13  ssa1  ; SyncOutA goes high (BST test data applied)
0200 0160 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0201 0161 00  tms0  ; BST chain 1, >> Capture DR
0202 0162 00  tms0  ; BST chain 1, >> Shift DR
0203 0163 1A  seltap0 ; switch to TAP 0
0204 0164 00  tms0  ; BST chain 0, >> Capture DR
0205 0165 00  tms0  ; BST chain 0, >> Shift DR
0206 0166 12  ssa0  ; SyncOutA goes low (BST test results captured)
0207 0167 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0208 0168 02 00 24  ld cnt,36 ; length of BST chain 0
0209 016B 05  nshfcp ; test pattern for short faults
0210 016C 000000000000 int8 .db $00,$00,$00,$00,$00,$00,$04,$08,$03,$fc,$54,$fc,$03,$01,$0f
0211 017B 06 04 01  jpe theend ; stop the test, if a short fault is found
0212 017E 01  tms1  ; BST chain 0, >> Update DR
0213 017F 01  tms1  ; BST chain 0, >> Sel. DR scan
0214 0180 1B  seltap1 ; switch to TAP 1
0215 0181 02 00 12  ld cnt,18 ; length of BST chain 1
0216 0184 05  nshfcp ; TP for short faults, BST chain 1
0217 0185 5AAA00030203 int9 .db $5a,$aa,$00,$03,$02,$03,$00,$00,$03
0218 018E 06 04 01  jpe theend ; stop the test, if a short fault is found
0219 0191 01  tms1  ; BST chain 1, >> Update DR
0220 0192 01  tms1  ; BST chain 1, >> Sel. DR scan
0221 0193 13  ssa1  ; SyncOutA goes high (BST test data applied)
0222 0194 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0223 0195 00  tms0  ; BST chain 1, >> Capture DR
0224 0196 00  tms0  ; BST chain 1, >> Shift DR
0225 0197 1A  seltap0 ; switch to TAP 0
0226 0198 00  tms0  ; BST chain 0, >> Capture DR
0227 0199 00  tms0  ; BST chain 0, >> Shift DR
0228 019A 12  ssa0  ; SyncOutA goes low (BST test results captured)
0229 019B 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0230 019C 02 00 24  ld cnt,36 ; length of BST chain 0
0231 019F 05  nshfcp ; test pattern for short faults
0232 01A0 000000000000 int10 .db $00,$00,$00,$00,$00,$00,$04,$04,$03,$fc,$a8,$fc,$03,$01,$0f
0233 01AF 06 04 01  jpe theend ; stop the test, if a short fault is found
0234 01B2 01  tms1  ; BST chain 0, >> Update DR
0235 01B3 01  tms1  ; BST chain 0, >> Sel. DR scan
0236 01B4 1B  seltap1 ; switch to TAP 1
0237 01B5 02 00 12  ld cnt,18 ; length of BST chain 1
0238 01B8 05  nshfcp ; TP for short faults, BST chain 1
0239 01B9 A55A00030103 int11 .db $a5,$5a,$00,$03,$01,$03,$00,$00,$03
0240 01C2 06 04 01  jpe theend ; stop the test, if a short fault is found
0241 01C5 01  tms1  ; BST chain 1, >> Update DR
0242 01C6 01  tms1  ; BST chain 1, >> Sel. DR scan
0243 01C7 13  ssa1  ; SyncOutA goes high (BST test data applied)
0244 01C8 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0245 01C9 00  tms0  ; BST chain 1, >> Capture DR
0246 01CA 00  tms0  ; BST chain 1, >> Shift DR
0247 01CB 1A  seltap0 ; switch to TAP 0
0248 01CC 00  tms0  ; BST chain 0, >> Capture DR
0249 01CD 00  tms0  ; BST chain 0, >> Shift DR
0250 01CE 12  ssa0  ; SyncOutA goes low (BST test results captured)
0251 01CF 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0252 01D0 02 00 24  ld cnt,36 ; length of BST chain 0
0253 01D3 05  nshfcp ; test pattern for short faults
0254 01D4 000000000000 int12 .db $00,$00,$00,$00,$00,$00,$08,$04,$03,$fc,$68,$fc,$03,$02,$0f
0255 01E3 06 04 01  jpe theend ; stop the test, if a short fault is found
0256 01E6 01  tms1  ; BST chain 0, >> Update DR
0257 01E7 01  tms1  ; BST chain 0, >> Sel. DR scan
0258 01E8 1B  seltap1 ; switch to TAP 1
0259 01E9 02 00 12  ld cnt,18 ; length of BST chain 1
0260 01EC 05  nshfcp ; TP for short faults, BST chain 1
0261 01ED 66A500030103 int13 .db $66,$a5,$00,$03,$01,$03,$00,$00,$03
0262 01F6 06 04 01  jpe theend ; stop the test, if a short fault is found
0263 01F9 01  tms1  ; BST chain 1, >> Update DR
0264 01FA 01  tms1  ; BST chain 1, >> Sel. DR scan
0265 01FB 13  ssa1  ; SyncOutA goes high (BST test data applied)
0266 01FC 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0267 01FD 00  tms0  ; BST chain 1, >> Capture DR
0268 01FE 00  tms0  ; BST chain 1, >> Shift DR
0269 01FF 1A  seltap0 ; switch to TAP 0
0270 0200 00  tms0  ; BST chain 0, >> Capture DR
0271 0201 00  tms0  ; BST chain 0, >> Shift DR
0272 0202 12  ssa0  ; SyncOutA goes low (BST test results captured)
0273 0203 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0274 0204 02 00 24  ld cnt,36 ; length of BST chain 0
0275 0207 05  nshfcp ; test pattern for short faults
0276 0208 000000000000 int14 .db $00,$00,$00,$00,$00,$00,$08,$08,$03,$fc,$98,$fc,$03,$02,$0f
0277 0217 06 04 01  jpe theend ; stop the test, if a short fault is found
0278 021A 01  tms1  ; BST chain 0, >> Update DR
0279 021B 01  tms1  ; BST chain 0, >> Sel. DR scan
0280 021C 1B  seltap1 ; switch to TAP 1
0281 021D 02 00 12  ld cnt,18 ; length of BST chain 1
0282 0220 05  nshfcp ; TP for short faults, BST chain 1
0283 0221 996600030203 int15 .db $99,$66,$00,$03,$02,$03,$00,$00,$03
0284 022A 06 04 01  jpe theend ; stop the test, if a short fault is found
0285 022D 01  tms1  ; BST chain 1, >> Update DR
0286 022E 01  tms1  ; BST chain 1, >> Sel. DR scan
0287 022F 13  ssa1  ; SyncOutA goes high (BST test data applied)
0288 0230 15  wsa1  ; wait for SyncInpA to go high (external test data applied)
0289 0231 00  tms0  ; BST chain 1, >> Capture DR
0290 0232 00  tms0  ; BST chain 1, >> Shift DR
0291 0233 1A  seltap0 ; switch to TAP 0
0292 0234 00  tms0  ; BST chain 0, >> Capture DR
0293 0235 00  tms0  ; BST chain 0, >> Shift DR
0294 0236 12  ssa0  ; SyncOutA goes low (BST test results captured)
0295 0237 14  wsa0  ; wait for SyncInpA to go low (ext. test results captured)
0296 0238 02 00 24  ld cnt,36 ; length of BST chain 0
0297 023B 05  nshfcp ; last test pattern for short faults, BS chain 0
0298 023C 000000000000 int16 .db $00,$00,$00,$00,$00,$00,$08,$08,$03,$fc,$a4,$fc,$03,$02,$0f
0299 024B 06 04 01  jpe theend ; stop the test, if a short fault is found
0300 024E 1B  seltap1 ; switch to TAP 1
0301 024F 02 00 12  ld cnt,18 ; length of BST chain 1
0302 0252 05  nshfcp ; last TP for short faults, BST chain 1
0303 0253 999900030203 int17 .db $99,$99,$00,$03,$02,$03,$00,$00,$03
0304 025C 06 04 01  jpe theend ; stop the test, if a short fault is found
0305 025F 1A  seltap0 ; switch to TAP 0
0306 0260