0440 0381
0441 0381 0F  serflg7 ; select error flag 7 (faults detected during internal test)
0442 0382 1A  seltap0 ; switch to BS chain 0
0443 0383 01  tms1  ; >> Update DR, BS chain 0
0444 0384 01  tms1  ; >> Select DR scan, BS chain 0
0445 0385 01  tms1  ; >> Select IR scan, BS chain 0
0446 0386 00  tms0  ; >> Capture IR, BS chain 0
0447 0387 00  tms0  ; >> Shift IR, BS chain 0
0448 0388 02 00 10  ld cnt,16 ; length of the IRs in scan chain 0
0449 038B 04  nshf  ; shift in the intest/bypass opcodes
0450 038C 00 00 com0 .db $00,$00
0451 038E 01  tms1  ; >> Update IR, BS chain 0
0452 038F 01  tms1  ; >> Select DR scan, BS chain 0
0453 0390 00  tms0  ; >> Capture DR, BS chain 0
0454 0391 00  tms0  ; >> Shift DR, BS chain 0
0455 0392 02 00 24  ld cnt,36 ; length of scan chain 0
0456 0395 04  nshf  ; shift the 1st TP for internal test (no compare)
0457 0396 FF55FF570D com1 .db $ff,$55,$ff,$57,$0d
0458 039B 01  tms1  ; >> Update DR, BS chain 0
0459 039C 01  tms1  ; >> Select DR scan, BS chain 0
0460 039D 00  tms0  ; >> Capture DR, BS chain 0
0461 039E 00  tms0  ; >> Shift DR, BS chain 0
0462 039F 02 00 24  ld cnt,36 ; length of scan chain 0
0463 03A2 05  nshfcp ; test pattern for internal test of components
0464 03A3 0055FFAAFF00 com2 .db $00,$55,$ff,$aa,$ff,$00,$03,$57,$fc,$a8,$fd,$03,$0e,$0f,$00
0465 03B2 01  tms1  ; >> Update DR, BS chain 0
0466 03B3 01  tms1  ; >> Select DR scan, BS chain 0
0467 03B4 00  tms0  ; >> Capture DR, BS chain 0
0468 03B5 00  tms0  ; >> Shift DR, BS chain 0
0469 03B6 02 00 24  ld cnt,36 ; length of scan chain 0
0470 03B9 05  nshfcp ; last test pattern for internal test of components
0471 03BA 00AAFFAA0000 com3 .db $00,$aa,$ff,$aa,$00,$00,$03,$a8,$fc,$a8,$02,$03,$0e,$00,$00
0472 03C9 1B  seltap1 ; switch to BS chain 1
0473 03CA 01  tms1  ; >> Update DR, BS chain 1
0474 03CB 01  tms1  ; >> Select DR scan, BS chain 1
0475 03CC 01  tms1  ; >> Select IR scan, BS chain 1
0476 03CD 00  tms0  ; >> Capture IR, BS chain 1
0477 03CE 00  tms0  ; >> Shift IR, BS chain 1
0478 03CF 02 00 08  ld cnt,8 ; length of the IRs in scan chain 1
0479 03D2 04  nshf  ; shift in the intest/bypass opcodes
0480 03D3 00 com4 .db $00
0481 03D4 01  tms1  ; >> Update IR, BS chain 1
0482 03D5 01  tms1  ; >> Select DR scan, BS chain 1
0483 03D6 00  tms0  ; >> Capture DR, BS chain 1
0484 03D7 00  tms0  ; >> Shift DR, BS chain 1
0485 03D8 02 00 12  ld cnt,18 ; length of scan chain 1
0486 03DB 04  nshf  ; shift the 1st TP for internal test (no compare)
0487 03DC FF 55 03 com5 .db $ff,$55,$03
0488 03DF 01  tms1  ; >> Update DR, BS chain 1
0489 03E0 01  tms1  ; >> Select DR scan, BS chain 1
0490 03E1 00  tms0  ; >> Capture DR, BS chain 1
0491 03E2 00  tms0  ; >> Shift DR, BS chain 1
0492 03E3 02 00 12  ld cnt,18 ; length of scan chain 1
0493 03E6 05  nshfcp ; test pattern for internal test of components
0494 03E7 0055FFAAFF00 com6 .db $00,$55,$ff,$aa,$ff,$00,$03,$03,$00
0495 03F0 01  tms1  ; >> Update DR, BS chain 1
0496 03F1 01  tms1  ; >> Select DR scan, BS chain 1
0497 03F2 00  tms0  ; >> Capture DR, BS chain 1
0498 03F3 00  tms0  ; >> Shift DR, BS chain 1
0499 03F4 02 00 12  ld cnt,18 ; length of scan chain 1
0500 03F7 05  nshfcp ; last test pattern for internal test of components
0501 03F8 00AAFFAA0000 com7 .db $00,$aa,$ff,$aa,$00,$00,$03,$00,$00
0502 0401