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Internal test of components: Test pattern number 1.
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Boundary scan chain number 0:
Test pattern:
TP[0][1]:
1 1 1 0 1 0 1 0 1 0 0 0 0 0 0 0 0 0 1 1 1 0 1 0 1 0 1 0 0 0 0 0 0 0 0 0
Expected result - shifted out while the next TP is shifted in:
ER[0][1]:
0 0 0 0 0 0 0 0 0 0 1 0 1 0 1 0 1 0 0 0 0 0 0 0 0 0 0 0 1 0 1 0 1 0 1 0
Mask bits (for this expected result):
MB[0][1]:
0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1
Boundary scan chain number 1:
Test pattern:
TP[1][1]:
1 1 1 0 1 0 1 0 1 0 0 0 0 0 0 0 0 0
Expected result - shifted out while the next TP is shifted in:
ER[1][1]:
0 0 0 0 0 0 0 0 0 0 1 0 1 0 1 0 1 0
Mask bits (for this expected result):
MB[1][1]:
0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1