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Internal test of components: Test pattern for shifting the intest/bypass opcodes:
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Boundary scan chain number 0:

Test pattern:
TP[0]:
 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

Boundary scan chain number 1:

Test pattern:
TP[1]:
 0 0 0 0 0 0 0 0