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Internal test of components: Test pattern for shifting the intest/bypass opcodes:
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Boundary scan chain number 0:
Test pattern:
TP[0]:
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Boundary scan chain number 1:
Test pattern:
TP[1]:
0 0 0 0 0 0 0 0