[previous] [next] [contents]    Testing non-BS clusters with multiple BS chains

The test methods illustrated in figures 1.a and 1.b are independent of how many BS chains exist in the board, since there are no scan operations involved. As for the situation represented in figure 1.c, where the BS infrastructure is used to test the cluster, the same protocol described for testing full-BS interconnects in boards with multiple BS chains should be applied.

(a) Full access.

(b) Peripheral access.

(c) Primary I/O access only.

Figure 1: Different BS / physical test channel access combinations for testing non-BS clusters.